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Diffstat (limited to 'gcc-4.9/gcc/testsuite/gcc.dg/dfp/pr41049.c')
-rw-r--r--gcc-4.9/gcc/testsuite/gcc.dg/dfp/pr41049.c562
1 files changed, 562 insertions, 0 deletions
diff --git a/gcc-4.9/gcc/testsuite/gcc.dg/dfp/pr41049.c b/gcc-4.9/gcc/testsuite/gcc.dg/dfp/pr41049.c
new file mode 100644
index 000000000..6187481ec
--- /dev/null
+++ b/gcc-4.9/gcc/testsuite/gcc.dg/dfp/pr41049.c
@@ -0,0 +1,562 @@
+/* { dg-options "-std=gnu99" } */
+
+/* The preferred exponent of the result of a conversion from an
+ integral type to a decimal float type is zero. A conversion at
+ either compile time or runtime should not change the number of
+ trailing zeroes. */
+
+#include "dfp-dbg.h"
+
+#define PASTE2(A,B) A ## B
+#define PASTE(A,B) PASTE2(A,B)
+
+#define TESTVAL_NEG(VAL,SUF,SIZE) \
+ x = PASTE(PASTE(VAL,.),SUF); \
+ si = VAL; \
+ sll = PASTE(VAL,LL); \
+ a = si; \
+ b = sll; \
+ c = VAL; \
+ d = PASTE(VAL,LL); \
+ if ((__builtin_memcmp ((void *)&x, (void *)&a, SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&x, (void *)&b,SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&x, (void *)&c,SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&x, (void *)&d,SIZE) != 0)) \
+ FAILURE
+
+#define TESTVAL_NEG_BIG(VAL,SUF,SIZE) \
+ x = PASTE(PASTE(VAL,.),SUF); \
+ sll = PASTE(VAL,LL); \
+ a = sll; \
+ b = PASTE(VAL,LL); \
+ if ((__builtin_memcmp ((void *)&x, (void *)&a, SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&x, (void *)&b,SIZE) != 0)) \
+ FAILURE
+
+#define TESTVAL_NONNEG(VAL,SUF,SIZE) \
+ x = PASTE(PASTE(VAL,.),SUF); \
+ si = VAL; \
+ ui = VAL; \
+ sll = PASTE(VAL,LL); \
+ ull = PASTE(VAL,ULL); \
+ a = si; \
+ b = sll; \
+ c = ui; \
+ d = ull; \
+ e = VAL; \
+ f = VAL; \
+ g = PASTE(VAL,LL); \
+ h = PASTE(VAL,ULL); \
+ if ((__builtin_memcmp ((void *)&x, (void *)&a, SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&x, (void *)&b,SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&x, (void *)&c,SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&x, (void *)&d,SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&x, (void *)&e,SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&x, (void *)&f,SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&x, (void *)&g,SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&x, (void *)&h,SIZE) != 0)) \
+ FAILURE
+
+#define TESTVAL_NONNEG_BIG(VAL,SUF,SIZE) \
+ x = PASTE(PASTE(VAL,.),SUF); \
+ sll = PASTE(VAL,LL); \
+ ull = PASTE(VAL,ULL); \
+ b = sll; \
+ d = ull; \
+ f = PASTE(VAL,LL); \
+ g = PASTE(VAL,ULL); \
+ if ((__builtin_memcmp ((void *)&x, (void *)&b, SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&d, (void *)&d,SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&f, (void *)&d,SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&g, (void *)&d,SIZE) != 0)) \
+ FAILURE
+
+#undef SUFFIX
+#define SUFFIX DF
+#undef TYPE
+#define TYPE _Decimal32
+
+void
+zeroes_32 (void)
+{
+ volatile TYPE x, a, b, c, d, e, f, g, h;
+ volatile int si;
+ volatile unsigned int ui;
+ volatile long long sll;
+ volatile unsigned long long ull;
+
+ TESTVAL_NONNEG (0, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (1, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (5, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (9, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (50, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (90, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (100, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (500, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (900, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (1000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (5000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (9000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (50000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (90000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (100000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (500000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (900000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (1000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (5000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (9000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (50000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (90000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (100000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (500000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (900000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (1000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (5000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (9000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (50000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (90000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (100000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (500000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (900000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (1000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (5000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (9000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (50000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (90000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (100000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (500000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (900000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (1000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (5000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (9000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (50000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (90000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (100000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (500000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (900000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (1000000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (5000000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (9000000000000000000, SUFFIX, sizeof (TYPE));
+
+ TESTVAL_NEG (0, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-1, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-5, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-9, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-50, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-90, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-100, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-500, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-900, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-1000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-5000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-9000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-50000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-90000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-100000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-500000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-900000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-1000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-5000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-9000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-50000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-90000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-100000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-500000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-900000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-1000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-5000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-9000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-50000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-90000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-100000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-500000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-900000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-1000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-5000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-9000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-50000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-90000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-100000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-500000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-900000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-1000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-5000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-9000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-50000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-90000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-100000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-500000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-900000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-1000000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-5000000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-9000000000000000000, SUFFIX, sizeof (TYPE));
+}
+
+void
+round_32 (void)
+{
+ volatile TYPE x, a, b, c, d, e, f, g, h;
+ volatile int si;
+ volatile unsigned int ui;
+ volatile long long sll;
+ volatile unsigned long long ull;
+
+ TESTVAL_NONNEG (10000049, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000050, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000051, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000001, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000002, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000003, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000004, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (100000049, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (100000051, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000006, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000007, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000008, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000009, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000010, SUFFIX, sizeof (TYPE));
+
+ TESTVAL_NEG (-10000049, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000050, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000051, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000001, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000002, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000003, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000004, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-100000049, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-100000051, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000006, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000007, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000008, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000009, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000010, SUFFIX, sizeof (TYPE));
+}
+
+#undef SUFFIX
+#define SUFFIX DD
+#undef TYPE
+#define TYPE _Decimal64
+
+void
+zeroes_64 (void)
+{
+ volatile TYPE x, a, b, c, d, e, f, g, h;
+ volatile int si;
+ volatile unsigned int ui;
+ volatile long long sll;
+ volatile unsigned long long ull;
+
+ TESTVAL_NONNEG (0, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (1, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (5, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (9, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (50, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (90, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (100, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (500, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (900, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (1000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (5000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (9000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (50000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (90000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (100000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (500000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (900000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (1000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (5000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (9000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (50000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (90000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (100000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (500000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (900000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (1000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (5000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (9000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (50000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (90000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (100000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (500000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (900000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (1000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (5000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (9000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (50000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (90000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (100000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (500000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (900000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (1000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (5000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (9000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (50000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (90000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (100000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (500000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (900000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (1000000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (5000000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (9000000000000000000, SUFFIX, sizeof (TYPE));
+
+ TESTVAL_NEG (0, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-1, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-5, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-9, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-50, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-90, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-100, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-500, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-900, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-1000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-5000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-9000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-50000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-90000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-100000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-500000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-900000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-1000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-5000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-9000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-50000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-90000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-100000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-500000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-900000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-1000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-5000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-9000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-50000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-90000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-100000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-500000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-900000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-1000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-5000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-9000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-50000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-90000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-100000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-500000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-900000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-1000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-5000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-9000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-50000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-90000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-100000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-500000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-900000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-1000000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-5000000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-9000000000000000000, SUFFIX, sizeof (TYPE));
+}
+
+void
+round_64 (void)
+{
+ volatile TYPE x, a, b, c, d, e, f, g, h;
+ volatile int si;
+ volatile unsigned int ui;
+ volatile long long sll;
+ volatile unsigned long long ull;
+
+ TESTVAL_NONNEG_BIG (10000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000001, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000002, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000003, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000004, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (100000000000000049, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (100000000000000051, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000006, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000007, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000008, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000009, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000010, SUFFIX, sizeof (TYPE));
+
+ TESTVAL_NEG_BIG (-10000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000001, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000002, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000003, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000004, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-100000000000000049, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-100000000000000051, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000006, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000007, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000008, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000009, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000010, SUFFIX, sizeof (TYPE));
+}
+
+#undef SUFFIX
+#define SUFFIX DL
+#undef TYPE
+#define TYPE _Decimal128
+
+void
+zeroes_128 (void)
+{
+ volatile TYPE x, a, b, c, d, e, f, g, h;
+ volatile int si;
+ volatile unsigned int ui;
+ volatile long long sll;
+ volatile unsigned long long ull;
+
+ TESTVAL_NONNEG (0, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (1, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (5, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (9, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (50, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (90, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (100, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (500, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (900, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (1000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (5000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (9000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (50000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (90000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (100000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (500000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (900000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (1000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (5000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (9000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (50000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (90000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (100000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (500000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (900000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (1000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (5000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (9000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (50000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (90000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (100000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (500000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (900000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (1000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (5000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (9000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (50000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (90000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (100000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (500000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (900000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (1000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (5000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (9000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (50000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (90000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (100000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (500000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (900000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (1000000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (5000000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (9000000000000000000, SUFFIX, sizeof (TYPE));
+
+ TESTVAL_NEG (0, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-1, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-5, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-9, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-50, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-90, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-100, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-500, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-900, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-1000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-5000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-9000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-50000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-90000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-100000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-500000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-900000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-1000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-5000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-9000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-50000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-90000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-100000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-500000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-900000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-1000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-5000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-9000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-50000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-90000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-100000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-500000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-900000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-1000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-5000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-9000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-50000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-90000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-100000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-500000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-900000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-1000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-5000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-9000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-50000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-90000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-100000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-500000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-900000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-1000000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-5000000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-9000000000000000000, SUFFIX, sizeof (TYPE));
+}
+
+
+int
+main ()
+{
+ zeroes_32 ();
+ zeroes_64 ();
+ zeroes_128 ();
+ round_32 ();
+ round_64 ();
+
+ FINISH
+}
generated by cgit v1.2.3 (git 2.25.1) at 2024-04-26 18:05:30 +0000