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/* { dg-do run } */
/* { dg-options "-O3 --save-temps" } */
#include <arm_neon.h>
extern void abort (void);
extern float fabsf (float);
extern double fabs (double);
#define NUM_TESTS 8
float input_s1[] = {0.1f, -0.1f, 0.4f, 10.3f, 200.0f, -800.0f, -13.0f, -0.5f};
float input_s2[] = {-0.2f, 0.4f, 0.04f, -100.3f, 2.0f, -80.0f, 13.0f, -0.5f};
double input_d1[] = {0.1, -0.1, 0.4, 10.3, 200.0, -800.0, -13.0, -0.5};
double input_d2[] = {-0.2, 0.4, 0.04, -100.3, 2.0, -80.0, 13.0, -0.5};
#define TEST(TEST, CMP, SUFFIX, WIDTH, F) \
int \
test_fca##TEST##SUFFIX##_float##WIDTH##_t (void) \
{ \
int ret = 0; \
int i = 0; \
uint##WIDTH##_t output[NUM_TESTS]; \
\
for (i = 0; i < NUM_TESTS; i++) \
{ \
float##WIDTH##_t f1 = fabs##F (input_##SUFFIX##1[i]); \
float##WIDTH##_t f2 = fabs##F (input_##SUFFIX##2[i]); \
/* Inhibit optimization of our linear test loop. */ \
asm volatile ("" : : : "memory"); \
output[i] = f1 CMP f2 ? -1 : 0; \
} \
\
for (i = 0; i < NUM_TESTS; i++) \
{ \
output[i] = vca##TEST##SUFFIX##_f##WIDTH (input_##SUFFIX##1[i], \
input_##SUFFIX##2[i]) \
^ output[i]; \
/* Inhibit autovectorization of our scalar test loop. */ \
asm volatile ("" : : : "memory"); \
} \
\
for (i = 0; i < NUM_TESTS; i++) \
ret |= output[i]; \
\
return ret; \
}
TEST (ge, >=, s, 32, f)
/* { dg-final { scan-assembler "facge\\ts\[0-9\]+, s\[0-9\]+, s\[0-9\]+" } } */
TEST (ge, >=, d, 64, )
/* { dg-final { scan-assembler "facge\\td\[0-9\]+, d\[0-9\]+, d\[0-9\]+" } } */
TEST (gt, >, s, 32, f)
/* { dg-final { scan-assembler "facgt\\ts\[0-9\]+, s\[0-9\]+, s\[0-9\]+" } } */
TEST (gt, >, d, 64, )
/* { dg-final { scan-assembler "facgt\\td\[0-9\]+, d\[0-9\]+, d\[0-9\]+" } } */
int
main (int argc, char **argv)
{
if (test_fcages_float32_t ())
abort ();
if (test_fcaged_float64_t ())
abort ();
if (test_fcagts_float32_t ())
abort ();
if (test_fcagtd_float64_t ())
abort ();
return 0;
}
/* { dg-final { cleanup-saved-temps } } */
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