/* { dg-do run } */ /* { dg-options "-O3 --save-temps" } */ #include extern void abort (void); extern float fabsf (float); extern double fabs (double); #define NUM_TESTS 8 float input_s1[] = {0.1f, -0.1f, 0.4f, 10.3f, 200.0f, -800.0f, -13.0f, -0.5f}; float input_s2[] = {-0.2f, 0.4f, 0.04f, -100.3f, 2.0f, -80.0f, 13.0f, -0.5f}; double input_d1[] = {0.1, -0.1, 0.4, 10.3, 200.0, -800.0, -13.0, -0.5}; double input_d2[] = {-0.2, 0.4, 0.04, -100.3, 2.0, -80.0, 13.0, -0.5}; #define TEST(TEST, CMP, SUFFIX, WIDTH, F) \ int \ test_fca##TEST##SUFFIX##_float##WIDTH##_t (void) \ { \ int ret = 0; \ int i = 0; \ uint##WIDTH##_t output[NUM_TESTS]; \ \ for (i = 0; i < NUM_TESTS; i++) \ { \ float##WIDTH##_t f1 = fabs##F (input_##SUFFIX##1[i]); \ float##WIDTH##_t f2 = fabs##F (input_##SUFFIX##2[i]); \ /* Inhibit optimization of our linear test loop. */ \ asm volatile ("" : : : "memory"); \ output[i] = f1 CMP f2 ? -1 : 0; \ } \ \ for (i = 0; i < NUM_TESTS; i++) \ { \ output[i] = vca##TEST##SUFFIX##_f##WIDTH (input_##SUFFIX##1[i], \ input_##SUFFIX##2[i]) \ ^ output[i]; \ /* Inhibit autovectorization of our scalar test loop. */ \ asm volatile ("" : : : "memory"); \ } \ \ for (i = 0; i < NUM_TESTS; i++) \ ret |= output[i]; \ \ return ret; \ } TEST (ge, >=, s, 32, f) /* { dg-final { scan-assembler "facge\\ts\[0-9\]+, s\[0-9\]+, s\[0-9\]+" } } */ TEST (ge, >=, d, 64, ) /* { dg-final { scan-assembler "facge\\td\[0-9\]+, d\[0-9\]+, d\[0-9\]+" } } */ TEST (gt, >, s, 32, f) /* { dg-final { scan-assembler "facgt\\ts\[0-9\]+, s\[0-9\]+, s\[0-9\]+" } } */ TEST (gt, >, d, 64, ) /* { dg-final { scan-assembler "facgt\\td\[0-9\]+, d\[0-9\]+, d\[0-9\]+" } } */ int main (int argc, char **argv) { if (test_fcages_float32_t ()) abort (); if (test_fcaged_float64_t ()) abort (); if (test_fcagts_float32_t ()) abort (); if (test_fcagtd_float64_t ()) abort (); return 0; } /* { dg-final { cleanup-saved-temps } } */